Unveiling Surface and Subsurface Atomic Vacancies in MoS2 with Lateral Force Microscopy

Unveiling Surface and Subsurface Atomic Vacancies in MoS2 with Lateral Force Microscopy - Featured

In this work, friction imaging is shown to detect atomic defects in MoS2, even when hidden below the surface, and to classify them through distinct friction fingerprints. This approach offers an accessible way to assess ultrathin material quality.
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