Unveiling Surface and Subsurface Atomic Vacancies in MoS2 with Lateral Force Microscopy In this work, friction imaging is shown to detect atomic defects in MoS2, even… Articles | July 14, 2026 | 94 |
Manish Chhowalla: Clean interfaces between MoS2 and high k dielectrics Excellent gate electrostatics in field effect transistors (FETs) based on two-dimensional transition metal dichalcogenide… IFIMAColloquium - Talks | July 1, 2026 | 21 |
Clean Interfaces Between MoS2 and High K Dielectrics Event Type: IFIMAColloquium Title: Clean interfaces between MoS2 and high k dielectrics When: Wednesday,… IFIMAColloquium | June 15, 2026 | 66 |